John Sepúlveda is an intellectual property attorney with deep technical experience across a wide range of advanced technologies, including semiconductors, analog and RF systems, digital electrical arts, data analytics, autonomous vehicles, IoT, computer hardware and software, artificial intelligence and machine learning, medical devices, data-enabled therapeutics, and fiber optics. He focuses his practice on patent prosecution, including drafting patent applications, conducting validity studies and clearance searches, and preparing responses to Office Actions.
Before transitioning to law, John spent more than 20 years as an electrical engineer designing microwave circuits and communications equipment for both commercial and defense applications. He has worked with leading organizations such as MITEQ, Frequency Electronics, Aeroflex, and L3. His extensive engineering background enables him to translate complex technologies into strategic intellectual property protection for clients.
John earned his J.D. from the Jacob D. Fuchsberg Law Center at Touro College, graduating magna cum laude, after pursuing a career in electrical engineering driven by a passion for innovation and design.
Associations
- New York Intellectual Property Law Association (NYIPLA)
- Long Island Hispanic Bar Association
- American Intellectual Property Law Association
Publications
- Sepúlveda, John (2019) “The Post-Jurisprudence Pendulum and its Effects on Patent Eligible Subject Matter,” Touro Law Review, Vol. 35, No. 2.
https://digitalcommons.tourolaw.edu/cgi/viewcontent.cgi?article=2976&context=lawreview - Sepúlveda, John (2018) “Dueling Claim Construction Standards at the PTAB and District Courts,” Touro Law Review Blog, August 1, 2018.
https://tourolawreviewblog.wordpress.com/2018/08/01/dueling-claim-construction-standards-at-the-ptab-and-district-courts/ - Sepúlveda, John (2017) “Computer Systems Fraud – Computer Systems Fraud in the Era of Big Data and EHRs,” Touro Law Review, Vol. 33, No. 2.
http://digitalcommons.tourolaw.edu/lawreview/vol33/iss2/11

